A resistance macromodel for deep-submicron process epi-type substrate based on the 2D device simulation is presented.
摘要提出了一种基于二维器件模拟的深亚微米工艺外延衬底的电阻宏模
。
A resistance macromodel for deep-submicron process epi-type substrate based on the 2D device simulation is presented.
摘要提出了一种基于二维器件模拟的深亚微米工艺外延衬底的电阻宏模
。
声明:以上例句、词性分类均由互联网资源自动生成,部分未经过人工审核,其表达内容亦不代表本软件的观;
现问题,欢迎向我们指正。
A resistance macromodel for deep-submicron process epi-type substrate based on the 2D device simulation is presented.
摘要提出了一种基于二维器件模亚微米工艺外延
衬底
电阻宏模
。
声明:以上例句、词性分类均由互联网动生成,部分未经过人工审核,其表达内容亦不代表本软件
观点;若发现问题,欢迎向我们指正。
A resistance macromodel for deep-submicron process epi-type substrate based on the 2D device simulation is presented.
摘要提出了一种基于二维器件模拟深亚微米工艺外延
电阻宏模
。
声明:以上、词性分类均由互联网资源自动生成,部分未经过人工审核,其表达内容亦不代表本软件
观点;若发现问题,欢迎向我们指正。
A resistance macromodel for deep-submicron process epi-type substrate based on the 2D device simulation is presented.
摘要提出了一种基于二维器件模拟的深亚微米工艺外延衬底的电阻宏模
。
声明:以上例句、词性分类均由互联网资源自动生成,部分未经过人工审核,其表达内容亦不代表本软件的;
发现问题,欢迎向我们指正。
A resistance macromodel for deep-submicron process epi-type substrate based on the 2D device simulation is presented.
摘要提出了一种基于二维器件模拟的深亚微米工艺外延衬底的电阻宏模
。
声明:以上句、词性分类均由互联网资源自动生成,部分未经过人工审核,其表达内
代表本软件的观点;若发现问题,欢迎向我们指正。
A resistance macromodel for deep-submicron process epi-type substrate based on the 2D device simulation is presented.
摘要一种基于二维器件模拟的深亚微米
艺外延
衬底的电阻宏模
。
声明:以上例句、词性分类均由互联网资源自动生成,部分未经过人,其表达内容亦不代表本软件的观点;若发现问题,欢迎向我们指正。
A resistance macromodel for deep-submicron process epi-type substrate based on the 2D device simulation is presented.
摘要提出了一二维器件模拟的深亚微米工艺外延
衬底的电阻宏模
。
声明:以上例句、词性分类均由互联网资源自动生成,部分人工审核,其表达内容亦不代表本软件的观点;若发现问题,欢迎向我们指正。
A resistance macromodel for deep-submicron process epi-type substrate based on the 2D device simulation is presented.
摘要提出了一种基于二维器件模拟的深亚微米工衬底的电阻宏模
。
声明:以上例句、词性由互联网资源自动生成,部
未经过人工审核,其表达内容亦不代表本软件的观点;若发现问题,欢迎向我们指正。
A resistance macromodel for deep-submicron process epi-type substrate based on the 2D device simulation is presented.
摘要提出了一种基于二维器件模拟微米工艺外延
衬底
电阻宏模
。
声明:以上例句、词性分类均由互联自动生成,部分未经过人工审核,其表达内容亦不代表本软件
观点;若发现问题,欢迎向我们指正。